EXPERIMENTAL STUDY OF REVERSE-BIAS SECOND BREAKDOWN.

Technical Digest - International Electron Devices Meeting

Volumn , Issue , 1980, Pages 297-301

  Blackburn, D L ^a   Berning, D W ^a  

^a NONE

Author keywords

[No Author keywords available]

Indexed keywords

TRANSISTORS;

EID: 0019248556     PISSN: 01631918     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/iedm.1980.189818     Document Type: Conference Paper

References (13)