Point pattern matching by relaxation

Pattern Recognition

Volumn 12, Issue 4, 1980, Pages 269-275

  Ranade, Sanjay ^a   Rosenfeld, Azriel ^a  

^a UNIVERSITY OF MARYLAND   (United States)

Author keywords

Landmarks; Matching; Point Patterns; Registration; Relaxation

Indexed keywords

PATTERN RECOGNITION SYSTEMS;

EID: 0019229247     PISSN: 00313203     EISSN: None     Source Type: Journal    
DOI: 10.1016/0031-3203(80)90067-9     Document Type: Article

References (5)

1. Some experiments in point pattern matching
2. An application of relaxation labelling to spring-loaded template matching
3. Parametric correspondence and chamfer matching: two new techniques for image matching
4. Computation of local parallel structure
5. Point pattern matching by relaxation