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Surface and Interface Analysis

Volumn 2, Issue 6, 1980, Pages 222-239

The quantitative analysis of surfaces by XPS: A review

(1) Seah, M P a

a NATIONAL PHYSICAL LABORATORY (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

SPECTROSCOPY, X-RAY;

SURFACES;

EID: 0019227571 PISSN: 01422421 EISSN: 10969918 Source Type: Journal
DOI: 10.1002/sia.740020607 Document Type: Article

Times cited : (383)

References (62)

1
- 85024820058
- National Bureau of Standards, Washington DC
- (1977) The National Measurement System for Surface Properties: Nat. Bur. Stand. US Internal Rep. 75–945
- Powell, C.J.¹

2
- 0008772860
- edited by, A. W. Czanderna, Elsevier, New York
- (1975) Methods of Surface Analysis , pp. 159
- Joshi, A.¹ Davis, L.E.² Palmberg, P.W.³

3
- 0004288549
- Plenum, New York, 1978
- (1975) Photoelectron and Auger Spectroscopy
- Carlson, T.A.¹

4
- 0003427392
- D. Briggs, Heyden, London
- (1977) Handbook of X‐Ray and Ultraviolet Photoelectron Spectroscopy

5
- 84892219143
- edited by, L. Fiermans, J. Vennik, W. Dekeyser, Plenum, New York
- (1978) Electron and Ion Spectroscopy of Solids: NATO Advanced Study Institutes Series B: Physics , vol.32 , pp. 324
- Werner, H.W.¹

6
- 0019051699
- (1980) Surf. Interface Anal. , vol.2 , pp. 148
- Hofmann, S.¹

7
- 0018722851
- (1979) Surf. Interface Anal. , vol.1 , pp. 204
- Walls, J.M.¹ Hall, D.D.² Sykes, D.E.³

8
- 0017947979
- (1978) Appl. Spectrosc. , vol.32 , pp. 175
- Bradley, L.¹ Bosworth, Y.M.² Briggs, D.³ Gibson, V.A.⁴ Oldman, R.J.⁵ Evans, A.C.⁶ Franks, J.⁷

9
- 0001298178
- (1977) Surf. Sci. , vol.68 , pp. 583
- Castle, J.E.¹

10
- 0000538358
- (1974) J. Electron Spectrosc. Relat. Phenom. , vol.5 , pp. 351
- Kim, K.S.¹ Baitinger, W.E.² Amy, J.W.³ Winograd, N.⁴

11
- 0018436046
- (1979) Surf. Interface Anal. , vol.1 , pp. 2
- Seah, M.P.¹ Dench, W.A.²

12
- 0000296435
- (1979) Surf. Sci. , vol.83 , pp. 391
- Hall, P.M.¹ Morabito, J.M.²

13
- 85024806003
- Analusis
- Seah, M.P.¹

14
- 0000532270
- (1979) J. Catal. , vol.57 , pp. 450
- Seah, M.P.¹

15
- 36849142077
- Sputtering Yields of Metals for Ar+ and Ne+ Ions with Energies from 50 to 600 ev
- (1961) Journal of Applied Physics , vol.32 , pp. 365
- Laegried, N.¹ Wehner, G.K.²

16
- 0342398121
- (1975) Thin Solid Films , vol.31 , pp. 89
- Honig, R.E.¹

17
- 0018434232
- (1979) Appl. Phys. , vol.18 , pp. 131
- Andersen, H.H.¹

18
- 0019871128
- (1980) Thin Solid Films , vol.75 , pp. 67
- Lea, C.¹ Seah, M.P.²

19
- 0001018430
- (1973) Surf. Sci. , vol.36 , pp. 817
- Shimizu, H.¹ Ono, M.² Nakayama, K.³

20
- 0016912161
- Auger study of preferred sputtering on Ag–Au alloy surfaces
- (1977) Journal of Vacuum Science and Technology , vol.14 , pp. 322
- Ho, P.S.¹ Lewis, J.E.² Howard, J.K.³

21
- 0141916891
- Chemistry of solid–solid interfaces — A review of its characterization, theory, and relevance to materials science
- (1980) Journal of Vacuum Science and Technology , vol.17 , pp. 16
- Seah, M.P.¹

22
- 1242268318
- edited by, A. W. Czanderna, Elsevier, New York
- (1975) Methods of Surface Analysis , pp. 5
- Wehner, G.K.¹

23
- 3643090763
- (1969) Phys. Rev. , vol.184 , pp. 383
- Sigmund, P.¹

24
- 0001595258
- (1969) Phys. Rev. , vol.187 , pp. 768

25
- 85024817585
- Seah, M.P.¹

26
- 0343045567
- (1979) Surf. Sci. , vol.85 , pp. 19
- Ho, P.S.¹ Lewis, J.E.² Chu, W.K.³

27
- 5244308046
- (1974) K. Dan. Vidensk. Selsk. Mat.‐Fys. Medd. , vol.39 , Issue.3 , pp. 1
- Andersen, N.¹ Sigmund, P.²

28
- 0043288433
- (1977) Surf. Sci. , vol.62 , pp. 1
- Hall, P.M.¹ Morabito, J.M.² Conley, D.K.³

29
- 0011671624
- (1975) J. Electron Spectrosc. Relat. Phenom. , vol.7 , pp. 1
- Barrie, A.¹ Street, F.J.²

30
- 47249091331
- (1976) J. Electron Spectrosc. Relat. Phenom. , vol.8 , pp. 389
- Reilman, R.F.¹ ezane, A.² Manson, S.T.³

31
- 0001602618
- (1974) J. Electron Spectrosc. Relat. Phenom. , vol.5 , pp. 725
- Fadley, C.S.¹

32
- 4444336735
- (1979) Surf. Sci. , vol.89 , pp. 52
- Fadley, C.S.¹ Kono, S.² Petersson, L.‐G.³ Goldberg, S.M.⁴ Hall, N.F.T.⁵ Lloyd, J.T.⁶ Hussain, Z.⁷

33
- 0342687376
- (1979) Surf. Sci. , vol.89 , pp. 64
- Evans, S.¹ Raftery, E.² Thomas, J.M.³

34
- 5544326388
- A preliminary study of pure metal surfaces using Auger Electron Spectroscopy (AES), X-ray Photoelectron Spectroscopy (XPS) and Secondary Ion Mass Spectroscopy (SIMS)
- (1975) Surface Science , vol.53 , pp. 636
- Gettins, M.¹ Coad, J.P.²

35
- 0010538067
- (1971) J. Phys. E , vol.4 , pp. 589
- Heddle, D.W.O.¹

36
- 34247234126
- (1938) Phys. Rev. , vol.54 , pp. 818
- Purcell, E.M.¹

37
- 0001613913
- (1967) Rev. Sci. Instrum. , vol.38 , pp. 103
- Kuyatt, C.E.¹ Simpson, J.A.²

38
- 0016069631
- (1974) Appl. Phys. , vol.4 , pp. 63
- Polaschegg, H.D.¹

39
- 0000273422
- (1969) Surf. Sci. , vol.17 , pp. 132
- Seah, M.P.¹

40
- 0000047718
- A step towards quantitative electron spectroscopy measurements by improved electron optics
- (1974) Journal of Electron Spectroscopy and Related Phenomena , vol.5 , pp. 705
- Noller, H.G.¹ Polaschegg, H.D.² Schillalies, H.³

41
- 0015996417
- A combined ESCA and Auger spectrometer
- (1975) Journal of Vacuum Science and Technology , vol.12 , pp. 379
- Palmberg, P.W.¹

42
- 84912220151
- (1970) Adv. X‐Ray Anal. , vol.13 , pp. 406
- Weichert, N.H.¹ Helmer, J.C.²

43
- 5844249260
- (1979) J. Electron Spectrosc. Relat. Phenom. , vol.17 , pp. 361
- Powell, C.J.¹ Erickson, N.E.² Madey, T.E.³

44
- 0041742046
- (1976) J. Electron. Spectrosc. Relat. Phenom. , vol.8 , pp. 129
- Scofield, J.H.¹

45
- 0004814110
- (1976) J. Electron Spectrosc. Relat. Phenom. , vol.8 , pp. 29
- Penn, D.R.¹

46
- 27344452796
- (1975) Anal. Chem. , vol.47 , pp. 21
- Swingle, R.S.¹

47
- 0000341363
- (1972) Anal. Chem. , vol.44 , pp. 1050
- Wagner, C.D.¹

48
- 37049133676
- (1972) Faraday Discuss. Chem. Soc. , vol.54 , pp. 269
- Jørgensen, C.K.¹ Berthou, H.²

49
- 0343165690
- (1973) J. Electron Spectrosc. Relat. Phenom. , vol.2 , pp. 383
- Nefedov, V.I.¹ Sergushin, N.P.² Band, I.M.³ Trzhakovskaya, M.B.⁴

50
- 0003305359
- (1975) J. Electron Spectrosc. Relat. Phenom. , vol.7 , pp. 175
- Nefedov, V.I.¹ Sergushin, N.P.² Salyn, Y.V.³ Band, I.M.⁴ Trzhakovskaya, M.B.⁵

51
- 0003305032
- (1975) Anal. Chem. , vol.47 , pp. 482
- Berthou, H.¹ Jørgensen, C.K.²

52
- 0016569994
- Elemental sensitivities of metals in x-ray photoelectron spectroscopy
- (1975) Analytical Chemistry , vol.47 , pp. 2200
- Janghorbani, M.¹ Vulli, M.² Starke, K.³

53
- 4243976754
- (1976) Surf. Sci. , vol.58 , pp. 457
- Brillson, L.J.¹ Ceasar, G.P.²

54
- 0017526792
- (1977) Anal. Chem. , vol.49 , pp. 1282
- Wagner, C.D.¹

55
- 33847089557
- (1977) Anal. Chem. , vol.48 , pp. 2001
- Adams, J.M.¹ Evans, S.² Reid, P.I.³ Thomas, J.M.⁴ Walters, M.J.⁵

56
- 36149044064
- (1977) J. Phys. C , vol.10 , pp. 2483
- Evans, S.¹ Pritchard, R.G.² Thomas, J.M.³

57
- 0001049333
- (1978) J. Electron Spectrosc. Relat. Phenom. , vol.14 , pp. 341
- Evans, S.¹ Pritchard, R.G.² Thomas, J.M.³

58
- 0003306027
- (1977) J. Microsc. Spectrosc. Electron. , vol.2 , pp. 57
- Vulli, M.¹ Starke, K.²

59
- 0019002651
- (1980) Surf. Interface Anal. , vol.2 , pp. 53
- Wagner, C.D.¹ Davis, L.E.² Riggs, W.M.³

60
- 34249980607
- ASTM STP 643, edited by, N. S. McIntyre, American Society for Testing and Materials, Philadelphia
- (1978) Quantitative Surface Analysis of Materials , pp. 31
- Wagner, C.D.¹

61
- 0003708258
- 2nd Edn., Physical Electronics Industries Inc., Minnesota
- (1976) Handbook of Auger Electron Spectroscopy
- Davis, L.E.¹ Macdonald, N.C.² Palmberg, P.W.³ Riach, G.E.⁴ Weber, R.E.⁵

62
- 34249980607
- ASTM STP 643, edited by, N. S. McIntyre, American Society for Testing and Materials, Philadelphia
- (1978) Quantitative Surface Analysis of Materials , pp. 5
- Powell, C.J.¹

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.