TEST GENERATION FOR DELAY FAULTS USING STUCK-AT-FAULT TEST SET.

Journal of Biomedical Engineering

Volumn , Issue , 1980, Pages 167-175

  Liaw, Chi Chang ^a   Su, Stephen Y H ^a   Malaiya, Yashwant K ^a  

^a NONE

Author keywords

[No Author keywords available]

Indexed keywords

LOGIC CIRCUITS;

EID: 0019149817     PISSN: 01415425     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Conference Paper

References (4)