Syntactic models in pattern recognition and applications.

Pattern recognition in practice. Proc. workshop Amsterdam, May 1980

Volumn , Issue , 1980, Pages

  Fu, K S ^a  

^a PURDUE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AUTOMATIC VISUAL INSPECTION; PRIMITIVE SELECTIONSTRUCTURAL ANALYSIS; SHAPE RECOGNITION; TEXTURE MODELLING; WAVEFORM ANALYSIS;

EID: 0019109761     PISSN: None     EISSN: None     Source Type: Book    
DOI: None     Document Type: Article

References (0)