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Volumn 27, Issue 8, 1980, Pages 1682-1687

MOS Area Sensor: Part II—Low-Noise MOS Area Sensor with Antiblooming Photodiodes

Author keywords

[No Author keywords available]

Indexed keywords

INTEGRATED CIRCUITS - VERY LARGE SCALE INTEGRATION; SEMICONDUCTOR DEVICES, MOS;

EID: 0019047401     PISSN: 00189383     EISSN: 15579646     Source Type: Journal    
DOI: 10.1109/T-ED.1980.20088     Document Type: Article
Times cited : (28)

References (17)
  • 3
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    • A low-light level self scanned MOS image sensor
    • J. D. Plummer and J. D. Meindl, “A low-light level self scanned MOS image sensor,” in ISSCC Dig. Tech. Papers, p. 30, 1972.
    • (1972) ISSCC Dig. Tech. Papers , pp. 30
    • Plummer, J.D.1    Meindl, J.D.2
  • 4
    • 84939040780 scopus 로고
    • Fairchild CCD 201 data sheet
    • Fairchild CCD 201 data sheet, 1975.
    • (1975)
  • 5
    • 84939057905 scopus 로고
    • Fairchild CCD 202 data sheet
    • Fairchild CCD 202 data sheet, 1976.
    • (1976)
  • 6
    • 0015330570 scopus 로고
    • MOS electronics for a portable reading aid for the blind
    • Apr.
    • J. D. Plummer and J. D. Meindl, “MOS electronics for a portable reading aid for the blind,” IEEE J. Solid-State Circuits, vol. SC-7, pp. 111–119, Apr. 1972.
    • (1972) IEEE J. Solid-State Circuits , vol.SC-7 , pp. 111-119
    • Plummer, J.D.1    Meindl, J.D.2
  • 7
    • 84939003664 scopus 로고
    • The resistive gate CTD area-image sensor
    • Feb.
    • H. Heyns and J. G. V. Santen, “The resistive gate CTD area-image sensor,” IEEE Trans. Electron Devices, vol. ED-25, pp. 135–139, Feb. 1978.
    • (1978) IEEE Trans. Electron Devices , vol.ED-25 , pp. 135-139
    • Heyns, H.1    Santen, J.G.V.2
  • 8
    • 84916448929 scopus 로고
    • A device structure and spatial spectrum for checker-pattern CCD color camera
    • Feb.
    • S. Ochi, S. Yamanaka, Y. Kanoh, and T. Nishimura, “A device structure and spatial spectrum for checker-pattern CCD color camera,” IEEE Trans. Electron Devices, vol. ED-25, pp. 261–266, Feb. 1978.
    • (1978) IEEE Trans. Electron Devices , vol.ED-25 , pp. 261-266
    • Ochi, S.1    Yamanaka, S.2    Kanoh, Y.3    Nishimura, T.4
  • 9
    • 84880846657 scopus 로고
    • Color imaging system using a single CCD area array
    • Feb.
    • P. L. P. Dillon, D. M. Lewis, and F. G. Kaspar, “Color imaging system using a single CCD area array,” IEEE Trans. Electron Devices, vol. ED-25, pp. 102–107, Feb. 1978.
    • (1978) IEEE Trans. Electron Devices , vol.ED-25 , pp. 102-107
    • Dillon, P.L.P.1    Lewis, D.M.2    Kaspar, F.G.3
  • 10
    • 0017877489 scopus 로고
    • Signal readout in CID image sensor
    • Feb.
    • C. Anagnostopoulos, “Signal readout in CID image sensor,” IEEE Trans. Electron Devices, vol. ED-25, pp. 85–89, Feb. 1978.
    • (1978) IEEE Trans. Electron Devices , vol.ED-25 , pp. 85-89
    • Anagnostopoulos, C.1
  • 12
    • 0018730506 scopus 로고
    • 512 × 486 cell CCD image sensor
    • K. Horii, “512 × 486 cell CCD image sensor,” J. Inst. Eng. Japan, vol. 33, no. 7, p. 523, 1979.
    • (1979) J. Inst. Eng. Japan , vol.33 , Issue.7 , pp. 523
    • Horii, K.1
  • 14
    • 0018668222 scopus 로고
    • Single-chip MOS color image senor
    • T. Takamura and H. Tanaka, “Single-chip MOS color image senor,” J. Inst. Telev. Eng. Japan, vol. 23, no. 7, p. 560, 1979.
    • (1979) J. Inst. Telev. Eng. Japan , vol.23 , Issue.7 , pp. 560
    • Takamura, T.1    Tanaka, H.2
  • 15
    • 84941858855 scopus 로고
    • Solid state Si image sensor and its design considerations
    • T. Ando, S. Akaboshi, and H. Ishihara, “Solid state Si image sensor and its design considerations,” J. Inst. Telev. Eng. Japan, vol. 26, no. 1, p. 33, 1972.
    • (1972) J. Inst. Telev. Eng. Japan , vol.26 , Issue.1 , pp. 33
    • Ando, T.1    Akaboshi, S.2    Ishihara, H.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.