Detection of Single Intermittent Faults in Sequential Circuits

IEEE Transactions on Computers

Volumn C-29, Issue 7, 1980, Pages 673-678

  Savir, Jacob ^a  

^a IBM T J WATSON RESEARCH CENTER   (United States)

Author keywords

deterministic and random testing; Error latency; input probability; intermittent fault; Markov chain; sequential circuit; state table

Indexed keywords

LOGIC CIRCUITS, SEQUENTIAL;

EID: 0019033106     PISSN: 00189340     EISSN: None     Source Type: Journal    
DOI: 10.1109/TC.1980.1675642     Document Type: Article

References (11)

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