메뉴 건너뛰기




Volumn C-29, Issue 6, 1980, Pages 429-441

Test Generation for Microprocessors

Author keywords

Architecture models; complexity of tests; functional level fault models; microprocessor architecture; test programs

Indexed keywords

COMPUTERS, MICROPROCESSOR;

EID: 0019030438     PISSN: 00189340     EISSN: None     Source Type: Journal    
DOI: 10.1109/TC.1980.1675602     Document Type: Article
Times cited : (235)

References (15)
  • 1
    • 0018051510 scopus 로고
    • Functional testing with binary decision diagrams
    • Toulouse, France: IEEE Comput. Soc. June
    • S. B. Akers, “Functional testing with binary decision diagrams,” in Proc. 8th Int. Conf. Fault-Tolerant Computing. Toulouse, France: IEEE Comput. Soc., June 1978, pp. 75–82.
    • (1978) Proc. 8th Int. Conf. Fault-Tolerant Computing , pp. 75-82
    • Akers, S.B.1
  • 2
    • 0016884683 scopus 로고
    • Two new approaches simplify testing of microprocessors
    • Jan. 22
    • A. C. L. Chiang and R. McCaskill, “Two new approaches simplify testing of microprocessors,” Electronics, pp. 100–105, Jan. 22, 1976.
    • (1976) Electronics , pp. 100-105
    • Chiang, A.C.L.1    McCaskill, R.2
  • 3
    • 84970147794 scopus 로고
    • Fourth annual microprocessor directory
    • Nov. 20
    • R. H. Cushman, “Fourth annual microprocessor directory,” EDN, vol. 22, pp. 44–83, Nov. 20, 1977.
    • (1977) EDN , vol.22 , pp. 44-83
    • Cushman, R.H.1
  • 4
    • 0016963705 scopus 로고
    • Truth-table verification of an iterative logic array
    • June
    • F. J. O. Dias, “Truth-table verification of an iterative logic array,” IEEE Trans. Comput., vol. C-25, 605–613, June 1976.
    • (1976) IEEE Trans. Comput. , vol.C-25 , pp. 605-613
    • Dias, F.J.O.1
  • 5
    • 78650330394 scopus 로고
    • 2nd ed.IEEE Comput. Soc., IEEE Catalog EHO 122–2
    • W. G. Fee, Tutorial LSI testing, 2nd ed. IEEE Comput. Soc., 1978, IEEE Catalog EHO 122–2.
    • (1978) Tutorial LSI testing
    • Fee, W.G.1
  • 6
    • 84882502223 scopus 로고
    • Trends and problems in computer organizations
    • Amsterdam, The Netherlands: North-Holland
    • M. J. Flynn, “Trends and problems in computer organizations,” in 1974 IFIP Proc. Amsterdam, The Netherlands: North-Holland, 1974, pp. 3–10.
    • (1974) 1974 IFIP Proc , pp. 3-10
    • Flynn, M.J.1
  • 8
    • 84902493692 scopus 로고
    • On computer self-diagnosis: Part I and II
    • Dec.
    • E. Manning, “On computer self-diagnosis: Part I and II,” IEEE Trans. Electron. Comput., vol. EC-15, pp. 873–890, Dec. 1966.
    • (1966) IEEE Trans. Electron. Comput. , vol.EC-15 , pp. 873-890
    • Manning, E.1
  • 9
    • 0016506916 scopus 로고
    • Diversified test methods for local control units
    • May
    • C. Robach and G. Saucier, “Diversified test methods for local control units,” IEEE Trans. Comput., vol. C-24, 562–567, May 1975.
    • (1975) IEEE Trans. Comput. , vol.C-24 , pp. 562-567
    • Robach, C.1    Saucier, G.2
  • 10
    • 0017994570 scopus 로고
    • Dynamic testing of control units
    • July
    • ― “Dynamic testing of control units,” IEEE Trans. Comput., vol. C-27, pp. 617–623, July 1978.
    • (1978) IEEE Trans. Comput. , vol.C-27 , pp. 617-623
  • 11
    • 84937994043 scopus 로고
    • An annotated bibliography of test and diagnostics
    • P. Scola, “An annotated bibliography of test and diagnostics,” Honeywell Comput. J., vol. 6, pp. 97-102, 105-162, 1972.
    • (1972) Honeywell Comput. J. , vol.6 , pp. 97-102
    • Scola, P.1
  • 12
    • 0018296224 scopus 로고
    • Testing bit-sliced microprocessors
    • Madison, WI: IEEE Comput. Soc. June
    • T. Sridhar and J. P. Hayes, “Testing bit-sliced microprocessors,” in Proc. 9th Int. Conf. Fault-Tolerant Computing. Madison, WI: IEEE Comput. Soc., June 1979, pp. 211–218.
    • (1979) Proc. 9th Int. Conf. Fault-Tolerant Computing , pp. 211-218
    • Sridhar, T.1    Hayes, J.P.2
  • 13
    • 84939395587 scopus 로고
    • Various papers on microprocessor testing in the Cherry Hill, NJ: IEEE Comput. Soc., Oct. 1975, 1976, 1977, 1978
    • Various papers on microprocessor testing in the Dig. of Semiconductor Testing Symp. Cherry Hill, NJ: IEEE Comput. Soc., Oct. 1975, 1976, 1977, 1978, 1979.
    • (1979) Dig. of Semiconductor Testing Symp
  • 14
    • 0018055970 scopus 로고
    • A methodology for functional level testing of microprocessors
    • Toulouse, France: IEEE Comput. Soc. June
    • S. M. Thatte and J. A. Abraham, “A methodology for functional level testing of microprocessors,” in Proc. 8th Int. Conf. Fault-Tolerant Computing. Toulouse, France: IEEE Comput. Soc., June 1978, pp. 90–95.
    • (1978) Proc. 8th Int. Conf. Fault-Tolerant Computing , pp. 90-95
    • Thatte, S.M.1    Abraham, J.A.2
  • 15
    • 33746151475 scopus 로고
    • Test generation for microprocessors
    • Coordinated Sci. Lab., Univ. Illinois, Urbana, IL, Rep. R-842
    • S. M. Thatte, “Test generation for microprocessors,” Coordinated Sci. Lab., Univ. Illinois, Urbana, IL, Rep. R-842, May 1979.
    • (1979)
    • Thatte, S.M.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.