Response of a Correlated Double Sampling Circuit to 1/f Noise

IEEE Journal of Solid-State Circuits

Volumn 15, Issue 3, 1980, Pages 373-375

  Kansy, Robert J ^a  

^a TEXAS INSTRUMENTS   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

SAMPLING CIRCUITS;

ELECTRONIC CIRCUITS, SWITCHING;

EID: 0019027110     PISSN: 00189200     EISSN: 1558173X     Source Type: Journal    
DOI: 10.1109/JSSC.1980.1051404     Document Type: Article

References (5)

1. W. H. White, D. R. Lampe, F. C. Blaha, and I. A. Mack “Characterization of surface channel CCD image arrays at low light levels,” IEEE J. Solid-State Circuits, vol. SC-9, pp. 1–14, Feb. 1974.
2. R. W. Brodersen and S. P. Emmons “Noise in buried channel charge-coupled devices,” IEEE J. Solid-State Circuits, vol. SC-11, pp. 147–156, Feb. 1976.
3. R. S. Ronen “Low frequency 1/f noise in MOSFETs,” RCA Rev., vol. 34, pp. 280–307, June 1973.
4. A. Papoulis, Probability, Random Variables, and Stochastic Process. New York: McGraw-Hill, 1965, ch. 10.
5. Handbook of Mathematical Functions, M. Abramowitz and I. A. Segun, Eds. New York: Dover, 1968, ch. 5.