Undetectability of Bridging Faults and Validity of Stuck-At Fault Test Sets

IEEE Transactions on Computers

Volumn C-29, Issue 1, 1980, Pages 55-59

  Kodandapani, K L ^a   Pradhan, Dhiraj K ^b  

^a WICHITA STATE UNIVERSITY   (United States)

^b OAKLAND UNIVERSITY   (United States)

Author keywords

Boolean difference; bridging faults; intergate bridging faults; intragate bridging faults; irredundant networks; redundancy; short circuits; two level networks; unate networks; undetectability

Indexed keywords

FAULT DETECTION;

ELECTRONIC CIRCUITS;

EID: 0018924690     PISSN: 00189340     EISSN: None     Source Type: Journal    
DOI: 10.1109/TC.1980.1675457     Document Type: Article

References (13)

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