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Volumn 51, Issue 1, 1980, Pages 784-790
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Modeling of a submicrometer gate field-effect transistor including effects of nonstationary electron dynamics
a a a a a
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UNIV LILLE
(France)
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Author keywords
[No Author keywords available]
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Indexed keywords
TRANSISTORS, FIELD EFFECT;
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EID: 0018879033
PISSN: 00218979
EISSN: None
Source Type: Journal
DOI: 10.1063/1.327292 Document Type: Article |
Times cited : (163)
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References (16)
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