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Volumn 51, Issue 1, 1980, Pages 784-790

Modeling of a submicrometer gate field-effect transistor including effects of nonstationary electron dynamics

Author keywords

[No Author keywords available]

Indexed keywords

TRANSISTORS, FIELD EFFECT;

EID: 0018879033     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.327292     Document Type: Article
Times cited : (163)

References (16)
  • 15
    • 84951353239 scopus 로고    scopus 로고
    • The diffusion coefficient D that we use is an equivalent non-steady-state diffusion coefficient which has been chosen in a first approximation as [formula omitted] where varυ(ε) is the variance and [formula omitted] is the correlation time of the velocity. The variations of varυ(ε) against energy have been established by fitting Monte Carlo results and [formula omitted] is deduced from Eq. (3).


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.