Monte Carlo calculations of structure-induced electromigration failure

Journal of Applied Physics

Volumn 51, Issue 1, 1980, Pages 513-521

  Schoen, J M ^a  

^a LUCENT TECHNOLOGIES   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

INTEGRATED CIRCUITS - FAILURE;

ELECTROMIGRATION;

ALUMINUM AND ALLOYS;

EID: 0018812353     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.327352     Document Type: Article

References (12)