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Volumn 64, Issue 1, 1979, Pages 1-8

Contact and thin film problems of submicron device structures

Author keywords

[No Author keywords available]

Indexed keywords

FILMS - METALLIC; SEMICONDUCTING GALLIUM COMPOUNDS;

EID: 0018809766     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/0040-6090(79)90534-0     Document Type: Article
Times cited : (2)

References (27)
  • 1
    • 0017974057 scopus 로고
    • Self-consistent proximity effect correction technique for resist exposure (SPECTRE)
    • (1978) J. Vac. Sci. Technol. , vol.15 , Issue.3 , pp. 931-933
    • Parikh1
  • 11
    • 0016506999 scopus 로고
    • Physical limits in digital electronics
    • (5)
    • (1975) Proc. IEEE , vol.63 , pp. 740-767
    • Keyes1
  • 13
    • 0001183185 scopus 로고
    • Oriented crystal growth on amorphous substrates using artificial surface relief gratings
    • (1978) Appl. Phys. Lett. , vol.32 , Issue.6 , pp. 349-350
    • Smith1    Flanders2
  • 14
    • 84918289870 scopus 로고
    • + silicon read impatt diodes
    • Cornell University, New York
    • (1979) Ph.D. Thesis , pp. 135-140
    • Gupta1
  • 16


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.