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Volumn 63, Issue 2, 1979, Pages 333-339

Microstructures of TiN and Ti2N deposits prepared by activated reactive evaporation

Author keywords

[No Author keywords available]

Indexed keywords

MICROSCOPIC EXAMINATION; PROTECTIVE COATINGS - X-RAY ANALYSIS;

EID: 0018809450     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/0040-6090(79)90037-3     Document Type: Article
Times cited : (64)

References (9)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.