METHOD OF DETERMINING RELIABILITY SCREENS FOR TIME DEPENDENT DIELECTRIC BREAKDOWN.

Annual Proceedings - Reliability Physics (Symposium)

Volumn , Issue , 1979, Pages 1-7

  Crook, Dwight L ^a  

^a NONE

Author keywords

[No Author keywords available]

Indexed keywords

RELIABILITY;

INTEGRATED CIRCUITS;

EID: 0018727292     PISSN: 00999512     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (8)