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Volumn , Issue , 1979, Pages 408-411
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MEASUREMENT OF MICROWAVE CHARACTERISTICS OF HELIX TRAVELING WAVE CIRCUITS.
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Author keywords
[No Author keywords available]
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Indexed keywords
ELECTRON TUBES, TRAVELING WAVE;
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EID: 0018705048
PISSN: None
EISSN: None
Source Type: Journal
DOI: 10.1109/iedm.1979.189639 Document Type: Conference Paper |
Times cited : (6)
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References (2)
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