Some aspects of error bounds in feature selection

Pattern Recognition

Volumn 11, Issue 5-6, 1979, Pages 353-360

  Boekee, D E ^a   van der Lubbe, J C A ^a  

^a DELFT UNIVERSITY OF TECHNOLOGY   (Netherlands)

Author keywords

Distance measures; Error bounds; f divergence; Feature evaluation; Information measures

Indexed keywords

BAYESIAN PROBABILITY OF ERROR; INFORMATION MEASURES;

PROBABILITY;

PATTERN RECOGNITION SYSTEMS;

EID: 0018691958     PISSN: 00313203     EISSN: None     Source Type: Journal    
DOI: 10.1016/0031-3203(79)90047-5     Document Type: Article

References (17)

1. On information and distance measures, error bounds, and feature selection
2. On a new class of bounds on Bayes risk in multihypothesis pattern recognition
3. On the dissimilarity of probability measures
4. The divergence and Bhattacharyya distance in signal selection
5. Patterns in pattern recognition 1968 1974
6. Mathematical methods of feature selection in pattern recognition
7. α-distance between posterior density functions
8. On the divergence between two distributions and the probability of misclassification of several decision rules
9. New families of probabilistic distance measures
10. Information-type measures of difference of probability distributions and indirect observations
11. Distance measures and related criteria
12. On the f-divergence and singularity of probability measures
13. Error probability in decision functions for character recognition
14. A class of upper bounds on probability of error for multihypothesis pattern recognition
15. R-norm information and a general class of measures for certainty and information