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Volumn , Issue , 1979, Pages 18-21
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CHARACTERIZATION OF THE ELECTRON MOBILITY IN THE INVERTED less than 100 greater than SI SURFACE.
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a
NONE
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Author keywords
[No Author keywords available]
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Indexed keywords
SEMICONDUCTOR DEVICES, MIS;
TRANSISTORS, FIELD EFFECT;
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EID: 0018683243
PISSN: None
EISSN: None
Source Type: Journal
DOI: None Document Type: Conference Paper |
Times cited : (184)
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References (1)
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