NEW CYCLIC BIASED T. H. B. TEST FOR POWER DISSIPATING IC'S.

Annual Proceedings - Reliability Physics (Symposium)

Volumn , Issue , 1979, Pages 118-126

  Ajiki, T ^a   Sugimoto, M ^a   Higuchi, Hiromu ^a   Kumada, S ^a  

^a NONE

Author keywords

[No Author keywords available]

Indexed keywords

RELIABILITY;

INTEGRATED CIRCUIT TESTING;

EID: 0018663846     PISSN: 00999512     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (3)