Detection of Faults in Programmable Logic Arrays

IEEE Transactions on Computers

Volumn C-28, Issue 11, 1979, Pages 845-853

  Smith, James E ^a  

^a UNIVERSITY OF WISCONSIN MADISON   (United States)

Author keywords

fault detection; fault modeling; Programmable logic arrays; test generation

Indexed keywords

FAULT DETECTION;

LOGIC CIRCUITS;

EID: 0018546155     PISSN: 00189340     EISSN: None     Source Type: Journal    
DOI: 10.1109/TC.1979.1675264     Document Type: Article

References (18)

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