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Volumn 26, Issue 11, 1979, Pages 1771-1776

The SIS Tunnel Emitter: A Theory for Emitters with Thin Interface Layers

Author keywords

[No Author keywords available]

Indexed keywords

TRANSISTORS, BIPOLAR;

EID: 0018545806     PISSN: 00189383     EISSN: 15579646     Source Type: Journal    
DOI: 10.1109/T-ED.1979.19684     Document Type: Article
Times cited : (178)

References (14)
  • 1
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    • Improvement of shallow base transistor technology by using a doped polysilicon diffusion source
    • (Suppl.)
    • M. Takagi, K. Nakayama, C. Tevada, and H. Kamioko, “Improvement of shallow base transistor technology by using a doped polysilicon diffusion source,” J. Jap. Soc. Appl. Phys. (Suppl.), vol. 42, p. 101, 1972.
    • (1972) J. Jap. Soc. Appl. Phys. , vol.42 , pp. 101
    • Takagi, M.1    Nakayama, K.2    Tevada, C.3    Kamioko, H.4
  • 2
    • 84941490101 scopus 로고
    • Der polysil Emitter-Eine neue Technologie für verbesserte Transistoreigenschaften
    • presented at the 6th Int. Congr. Microelectr., Munich, Germany
    • H. Murrmann and A. Glasl, “Der polysil Emitter-Eine neue Technologie für verbesserte Transistoreigenschaften,” presented at the 6th Int. Congr. Microelectr., Munich, Germany, 1974.
    • (1974)
    • Murrmann, H.1    Glasl, A.2
  • 3
    • 0016542423 scopus 로고
    • High-performance transistors with arsenic-implanted polysil emitters
    • J. Graul, A. Glasl, and H. Murrmann, “High-performance transistors with arsenic-implanted polysil emitters,” IEEE J. Solid-State Circuits, vol. SC-11, p. 491, 1976.
    • (1976) IEEE J. Solid-State Circuits , vol.SC-11 , pp. 491
    • Graul, J.1    Glasl, A.2    Murrmann, H.3
  • 4
    • 0010584131 scopus 로고
    • The temperature dependence of ideal gain in double diffused silicon transistors
    • W. L. Kauffman and A. A. Bergh, “The temperature dependence of ideal gain in double diffused silicon transistors,” IEEE Trans. Electron Devices, vol. ED-15, p. 732, 1968.
    • (1968) IEEE Trans. Electron Devices , vol.ED-15 , pp. 732
    • Kauffman, W.L.1    Bergh, A.A.2
  • 5
    • 0017014216 scopus 로고
    • Measurement of bandgap narrowing in Si bipolar transistors
    • J. W. Slotboom and H. C. de Graaff, “Measurement of bandgap narrowing in Si bipolar transistors,” Solid-State Electron., vol. 19, p. 857, 1976.
    • (1976) Solid-State Electron. , vol.19 , pp. 857
    • Slotboom, J.W.1    de Graaff, H.C.2
  • 6
    • 0016597193 scopus 로고
    • The electrical properties of polycrystalline silicon films
    • J. Y. W. Seto, “The electrical properties of polycrystalline silicon films,” J. Appl: Phys., vol. 46, p. 5247, 1975.
    • (1975) J. Appl: Phys. , vol.46 , pp. 5247
    • Seto, J.Y.W.1
  • 7
    • 0017480874 scopus 로고
    • Electronic processes at grain boundaries in polycrystalline semiconductors under optical illumination
    • H. C. Card and E. S. Yang, “Electronic processes at grain boundaries in polycrystalline semiconductors under optical illumination,” IEEE Trans. Electron Devices, vol. ED-24, p. 397, 1977.
    • (1977) IEEE Trans. Electron Devices , vol.ED-24 , pp. 397
    • Card, H.C.1    Yang, E.S.2
  • 8
    • 0001537507 scopus 로고
    • Volt-current characteristics for tunneling through insulating films
    • R. Stratton, “Volt-current characteristics for tunneling through insulating films,” J. Phys. Chem. Solids, vol. 23, p. 1177, 1962.
    • (1962) J. Phys. Chem. Solids , vol.23 , pp. 1177
    • Stratton, R.1
  • 9
  • 10
    • 0006658834 scopus 로고
    • Measurements of the number of impurities in the base layer of a transistor
    • H. K. Gummel, “Measurements of the number of impurities in the base layer of a transistor,” Proc. IRE, vol. 49, p. 834, 1961.
    • (1961) Proc. IRE , vol.49 , pp. 834
    • Gummel, H.K.1
  • 12
    • 0017634660 scopus 로고
    • Photovoltaic properties of MIS-Schottky barriers
    • H. C. Card, “Photovoltaic properties of MIS-Schottky barriers,” Solid-State Electron., vol. 20, p. 971, 1977.
    • (1977) Solid-State Electron. , vol.20 , pp. 971
    • Card, H.C.1
  • 13
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    • New York: Wiley-Interscience, Interscience
    • S. M. Sze, Physics of Semiconductor Devices. New York: Wiley-Interscience, Interscience, 1969, p. 378.
    • (1969) Physics of Semiconductor Devices , pp. 378
    • Sze, S.M.1
  • 14
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    • The pn-product in silicon
    • J. W. Slotboom, “The pn-product in silicon,” Solid-State Electron., vol. 20, p. 279, 1977.
    • (1977) Solid-State Electron. , vol.20 , pp. 279
    • Slotboom, J.W.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.