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Volumn 50, Issue 10, 1979, Pages 6366-6372
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Electron trapping in SiO2 at 295 and 77 °K
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Author keywords
[No Author keywords available]
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Indexed keywords
DIELECTRIC MATERIALS;
SEMICONDUCTOR DEVICES, MIS;
SILICA;
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EID: 0018531802
PISSN: 00218979
EISSN: None
Source Type: Journal
DOI: 10.1063/1.325727 Document Type: Article |
Times cited : (219)
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References (12)
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