LOCAL ATOMIC AND ELECTRONIC STRUCTURE OF OXIDE/GaAs AND SiO2/Si INTERFACES USING HIGH-RESOLUTION XPS.

Journal of vacuum science & technology

Volumn 16, Issue 5, 1979, Pages 1443-1453

  Grunthaner, F J ^a   Grunthaner, P J ^a   Vasquez, R P ^a   Lewis, B F ^a   Maserjian, J ^a  

^a NONE

Author keywords

[No Author keywords available]

Indexed keywords

SEMICONDUCTOR DEVICES;

EID: 0018522041     PISSN: 00225355     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.570218     Document Type: Conference Paper

References (25)