A new method for measuring the statistical resolution of scintillation detectors

Nuclear Instruments and Methods

Volumn 164, Issue 3, 1979, Pages 447-451

  Murayama, Hideo ^a   Tanaka, Eiichi ^a   Nohara, Norimasa ^a  

^a NATIONAL INSTITUTE OF RADIOLOGICAL SCIENCES   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

GAMMA RAYS - DETECTION;

SCINTILLATION COUNTERS;

EID: 0018516850     PISSN: 0029554X     EISSN: None     Source Type: Journal    
DOI: 10.1016/0029-554X(79)90078-8     Document Type: Article

References (13)

1. The Contribution of the NaI(Tl) Crystal to the Total Linewidth of NaI(Tl) Scintillation Counters
2. Resolution and Line Shape in Scintillation Counters
3. Intrinsic Scintillator Resolution