메뉴 건너뛰기




Volumn 2, Issue 2, 1979, Pages 180-195

Temperature Aging of External Connections Condensation Soldered to Ti-Pd-Au Thin Films

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC CONDUCTORS - JOINTS; INTEGRATED CIRCUIT TESTING; INTEGRATED CIRCUITS, HYBRID; SOLDERS - AGING;

EID: 0018483059     PISSN: 01486411     EISSN: None     Source Type: Journal    
DOI: 10.1109/TCHMT.1979.1135443     Document Type: Article
Times cited : (43)

References (27)
  • 1
    • 85169412339 scopus 로고
    • Embrittlement of solder by gold from plated surfaces
    • A.S.T.M. Special Tech. Pub., no. 319
    • F. G. Foster, “Embrittlement of solder by gold from plated surfaces,” A.S.T.M. Special Tech. Pub., no. 319, pp. 13-19, 1962.
    • (1962) , pp. 13-19
    • Foster, F.G.1
  • 2
    • 0014615846 scopus 로고
    • Dissolution of Au, Ag, Pd, Pt, Cu and Ni in a molten tin-lead solder
    • Dec.
    • W. G. Bader, “Dissolution of Au, Ag, Pd, Pt, Cu and Ni in a molten tin-lead solder,” Welding Research Supplement, pp. 551-7, Dec. 1969.
    • (1969) Welding Research Supplement , pp. 551-557
    • Bader, W.G.1
  • 3
    • 84939755723 scopus 로고
    • Experiemental observations on the effect of gold and palladium on soldered joints
    • J. Whitfield and A. J. Cubbin, “Experiemental observations on the effect of gold and palladium on soldered joints,” A. T.E. Journal, vol. 24, no. 1, 1965.
    • (1965) A. T.E. Journal , vol.24 , Issue.1
    • Whitfield, J.1    Cubbin, A.J.2
  • 7
    • 84914440628 scopus 로고
    • Vapor condensation soldering of external leads to thin film hybrid integrated circuits
    • L. W. Condra, “Vapor condensation soldering of external leads to thin film hybrid integrated circuits,” in Proc. 27th Electron. Components Conf., pp. 135-140, 1977.
    • (1977) Proc. 27th Electron. Components Conf. , pp. 135-140
    • Condra, L.W.1
  • 8
    • 84918271638 scopus 로고
    • Solder dissolution rates of evaporated and sputtered Ti-Pd-Au and NiCr-Au thin films
    • R. H. Minetti and L. J. Rickabaugh, “Solder dissolution rates of evaporated and sputtered Ti-Pd-Au and NiCr-Au thin films,” in Proc. 27th Electron. Components Conf., pp. 212-219, 1977.
    • (1977) Proc. 27th Electron. Components Conf. , pp. 212-219
    • Minetti, R.H.1    Rickabaugh, L.J.2
  • 9
    • 84936489520 scopus 로고
    • The effect of thin film deposition angle and substrate surface roughness on film dissolution in molten 60% Sn-40% Pb solder
    • L. J. Rickabaugh, “The effect of thin film deposition angle and substrate surface roughness on film dissolution in molten 60% Sn-40% Pb solder,” Electrocomp. Sci. Tech., vol. 4, no. 1, pp. 43-46, 1977.
    • (1977) Electrocomp. Sci. Tech. , vol.4 , Issue.1 , pp. 43-46
    • Rickabaugh, L.J.1
  • 10
    • 84939699287 scopus 로고    scopus 로고
    • unpublished memorandum
    • L. J. Rickabaugh, unpublished memorandum.
    • Rickabaugh, L.J.1
  • 11
    • 84939757527 scopus 로고
    • Corrosion of solder-coated TiPdAu thin film conductors in a moist chlorine atmosphere
    • F. N. Fuss and C. T. Hartwig, “Corrosion of solder-coated TiPdAu thin film conductors in a moist chlorine atmosphere,” in Proc. 27th Electron. Components Conf, pp. 72-83, 1977.
    • (1977) Proc. 27th Electron. Components Conf , pp. 72-83
    • Fuss, F.N.1    Hartwig, C.T.2
  • 13
    • 0017933267 scopus 로고
    • Failure analysis of solder joints
    • R. A. Bulwith, “Failure analysis of solder joints,” Insulation Circuits, vol. 24, no. 2, pp. 19-23, 1978.
    • (1978) Insulation Circuits , vol.24 , Issue.2 , pp. 19-23
    • Bulwith, R.A.1
  • 15
    • 84939051085 scopus 로고
    • Solders, solderable finishes and reflowed solder coatings
    • M. L. Ackroyd and C. A. MacKay, “Solders, solderable finishes and reflowed solder coatings,” Circuit World, vol. 3, no. 2, pp. 6-12, 1977.
    • (1977) Circuit World , vol.3 , Issue.2 , pp. 6-12
    • Ackroyd, M.L.1    MacKay, C.A.2
  • 16
    • 0016928799 scopus 로고
    • Diffusion mechanisms in the Pd/Au thin film system and the correlation of resistivity change with auger electron spectroscopy and Rutherford backscattering profiles
    • P. M. Hall, J. M. Morabito, and J. M. Poate, “Diffusion mechanisms in the Pd/Au thin film system and the correlation of resistivity change with auger electron spectroscopy and Rutherford backscattering profiles,” Thin Solid Films, vol. 33, pp. 107-134, 1976.
    • (1976) Thin Solid Films , vol.33 , pp. 107-134
    • Hall, P.M.1    Morabito, J.M.2    Poate, J.M.3
  • 17
    • 84939763951 scopus 로고
    • The soft soldering of gold plated surfaces, A review
    • Rep. No. MEC/R446/1974/806, Standard Telecommunication Laboratories LTD, Mar. 19
    • G. M. Green, “The soft soldering of gold plated surfaces, A review,” Rep. No. MEC/R446/1974/806, Standard Telecommunication Laboratories LTD, Mar. 19, 1974.
    • (1974)
    • Green, G.M.1
  • 18
    • 0009263197 scopus 로고
    • Effects of intermetallics on the reliability of tin coated Cu, Ag, and Ni parts
    • D. Olsen, R. Wright, and H. Berg, “Effects of intermetallics on the reliability of tin coated Cu, Ag, and Ni parts,” in Proc. 13th Ann. Reliability Physics Symp., pp. 80-86, 1975.
    • (1975) Proc. 13th Ann. Reliability Physics Symp. , pp. 80-86
    • Olsen, D.1    Wright, R.2    Berg, H.3
  • 19
    • 0015602104 scopus 로고
    • An investigation of soldered copper-tin bond brittleness by electron microscopy
    • P. L. Blum, J. Pelissier, and G. Silvestre, “An investigation of soldered copper-tin bond brittleness by electron microscopy,” Solid State Technol, vol. 16, pp. 55-58, 1973.
    • (1973) Solid State Technol , vol.16 , pp. 55-58
    • Blum, P.L.1    Pelissier, J.2    Silvestre, G.3
  • 20
    • 0016930611 scopus 로고
    • The growth of intermetallic compounds on common basis materials coated with tin and tin-lead alloys
    • P. J. Kay and C. A. MacKay, “The growth of intermetallic compounds on common basis materials coated with tin and tin-lead alloys,” Trans. Inst. Metal Finishing, vol. 54, pp. 68-74, 1976.
    • (1976) Trans. Inst. Metal Finishing , vol.54 , pp. 68-74
    • Kay, P.J.1    MacKay, C.A.2
  • 21
    • 0015614563 scopus 로고
    • Interdiffusion and reaction in bimetallic Cu-Sn thin films
    • K. N. Tu, “Interdiffusion and reaction in bimetallic Cu-Sn thin films,” Acta Metallurgica, vol. 21, pp. 347-354, 1973.
    • (1973) Acta Metallurgica , vol.21 , pp. 347-354
    • Tu, K.N.1
  • 26
    • 0017006354 scopus 로고
    • Room temperature aging properties of some solder alloys
    • B. T. Lampe, “Room temperature aging properties of some solder alloys,” Welding J., vol. 55, no. 10, pp. 300S-340S, 1976.
    • (1976) Welding J. , vol.55 , Issue.10 , pp. 300S-340S
    • Lampe, B.T.1
  • 27
    • 84939735041 scopus 로고    scopus 로고
    • unpublished work in progress
    • H. N. Keller, unpublished work in progress.
    • Keller, H.N.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.