Theory of Carrier Multiplication and Noise in Avalanche Devices—Part I: One-Carrier Processes

IEEE Transactions on Electron Devices

Volumn 26, Issue 5, 1979, Pages 746-751

  Van Vliet, Karel M ^a   Rucker, Lucien M ^a,b  

^a UNIVERSITY OF FLORIDA   (United States)

^b LUCENT TECHNOLOGIES   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

SEMICONDUCTOR DIODES, AVALANCHE;

EID: 0018467683     PISSN: 00189383     EISSN: 15579646     Source Type: Journal    
DOI: 10.1109/T-ED.1979.19489     Document Type: Article

References (10)

1. A. S. Tager, “Current fluctuations in a semiconductor (dielectric) under the condition of impact ionization and avalanche breakdown,” Sov. Phys.-Solid State, vol. 6, pp. 1919–1925, 1965.
2. R. J. McIntyre, “Multiplication noise in uniform avalanche diodes,” IEEE Trans. Electron Devices, vol. ED-13, pp. 164–168, 168, 1966.
3. “The distribution of gains in uniformly multiplying avalanche photodiodes. Theory,” IEEE Trans. Electron Devices, vol. ED-19, pp. 703–713, 1973.
4. A. van der Ziel and E. R. Chenette, “Noise in solid state devices,” in Advances in Electron Physics, vol. 46, L. Marton, Ed. New York: Academic Press, pp. 313–383.
5. W. Lukaszek, A. van der Ziel, and E. R. Chenette, “Investigation of the transition from tunneling to impact ionization multiplication in silicon p-n junctions,” Solid-State Electron., vol. 19, pp. 57–71, 1976.
6. L. M. Rucker and A. van der Ziel, “Noise associated with JFET gate current resulting from avalanching in the channel,” Solid-State State Electron., vol. 21, pp. 798–799, 1978.
7. S. D. Personick, “New results on avalanche multiplication statistics with applications to optical detection” Bell Syst. Tech. J., vol. 50, pp. 167–190, 1971.
8. R. E. Burgess, Disc. Faraday Soc., vol. 28, p. 151, 1959.
9. W. Feller, An Introduction to Probability Theory and Its Applications, vol. I. New York: Wiley, 1950, ch. XII.
10. K. M. van Vliet and L. M. Rucker, “Noise associated with reduction, multiplication, and branching processes,” Physica, in press.