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Volumn 62, Issue 5-6, 1979, Pages 298-305

Microstructural Development in MgO‐Partially Stabilized Zirconia (Mg‐PSZ)

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[No Author keywords available]

Indexed keywords

REFRACTORY MATERIALS;

EID: 0018466122     PISSN: 00027820     EISSN: 15512916     Source Type: Journal    
DOI: 10.1111/j.1151-2916.1979.tb09484.x     Document Type: Article
Times cited : (328)

References (26)
  • 20
    • 84979375767 scopus 로고    scopus 로고
    • Application of Transmission Electron Microscopy to Engineering Practice in Ceramics: Introduction, Fundamentals. and Application to Precipitation Phenomena”: this issue. pp.
    • Heuer, A.H.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.