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Volumn 26, Issue 4, 1979, Pages 446-453

Short-Channel MOSFET's in the Punchthrough Current Mode

Author keywords

[No Author keywords available]

Indexed keywords

INTEGRATED CIRCUITS - LARGE SCALE INTEGRATION;

EID: 0018456156     PISSN: 00189383     EISSN: 15579646     Source Type: Journal    
DOI: 10.1109/T-ED.1979.19447     Document Type: Article
Times cited : (32)

References (14)
  • 2
    • 84939054631 scopus 로고
    • Computer aided engineering of semiconductor integrated circuits
    • Feb.
    • J. D. Meindl et al, “Computer aided engineering of semiconductor integrated circuits Stanford Univ. IC Lab. Rep., SEL 78-011,pp.177–197,Feb. 1978.
    • (1978) Stanford Univ. IC Lab. Rep. , vol.SEL 78-011 , pp. 177-197
    • Meindl, J.D.1
  • 4
    • 0016049539 scopus 로고
    • Subthreshold design consideration for insulated gate field-effect transistors
    • Apr.
    • R. R. Troutman, “Subthreshold design consideration for insulated gate field-effect transistors IEEE J. Solid-State Circuits, vol. SC-9, p. 57, Apr. 1974.
    • (1974) IEEE J. Solid-State Circuits , vol.SC-9 , pp. 57
    • Troutman, R.R.1
  • 5
    • 0017943041 scopus 로고
    • Subthreshold conduction in MOSFETs
    • Mar.
    • G. W. Taylor, “Subthreshold conduction in MOSFETs,” IEEE Trans. Electron Devices, vol. ED-25, pp. 337–350, Mar. 1978.
    • (1978) IEEE Trans. Electron Devices , vol.ED-25 , pp. 337-350
    • Taylor, G.W.1
  • 6
    • 84944979497 scopus 로고
    • Fundamental performance limits of MOS integrated circuits
    • Feb.
    • R. M. Swanson and J. D. Meindl, “Fundamental performance limits of MOS integrated circuits in Digest Int. Solid State Circuits Conf, pp. 110–111, Feb. 1975.
    • (1975) Digest Int. Solid State Circuits Conf , pp. 110-111
    • Swanson, R.M.1    Meindl, J.D.2
  • 9
    • 0015756587 scopus 로고
    • Punchthrough currents in short-channel MOST devices
    • Dec.
    • R. A. Stuart and W. Eccleston, “Punchthrough currents in short-channel MOST devices Electron. Lett., vol. 9, pp. 586–588, Dec. 1973.
    • (1973) Electron. Lett. , vol.9 , pp. 586-588
    • Stuart, R.A.1    Eccleston, W.2
  • 11
    • 0000175457 scopus 로고
    • The silicon insulated gate field-effect transistor
    • Sept.
    • S. R. Hofstein and F. P. Heiman, “The silicon insulated gate field-effect transistor Proc. IEEE, pp. 1190-1202, Sept. 1963.
    • (1963) Proc. IEEE , pp. 1190-1202
    • Hofstein, S.R.1    Heiman, F.P.2
  • 12
    • 14844294701 scopus 로고
    • VLSI limitations from drain-induced barrier-lowering
    • Nov.
    • R. R. Troutman, “VLSI limitations from drain-induced barrier-lowering,” IEEE Trans. Electron Devices, vol. ED-25, p. 1344, Nov. 1978.
    • (1978) IEEE Trans. Electron Devices , vol.ED-25 , pp. 1344
    • Troutman, R.R.1
  • 13
    • 0014566970 scopus 로고
    • Modulation of space-charge-limited current flow in insulated-gate field effect tetrodes
    • Sept.
    • P. Richman, “Modulation of space-charge-limited current flow in insulated-gate field effect tetrodes IEEE Trans. Electron Devices, vol. ED-16, pp. 759–766, Sept. 1969.
    • (1969) IEEE Trans. Electron Devices , vol.ED-16 , pp. 759-766
    • Richman, P.1
  • 14
    • 0017467243 scopus 로고
    • Double boron implanted short-channel MOSFET
    • Mar.
    • P. P. Wang, “Double boron implanted short-channel MOSFET IEEE Trans. Electron Devices, vol. ED-24, pp. 196–206, Mar. 1977.
    • (1977) IEEE Trans. Electron Devices , vol.ED-24 , pp. 196-206
    • Wang, P.P.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.