VLSI Limitations from Drain-Induced Barrier Lowering

IEEE Transactions on Electron Devices

Volumn 26, Issue 4, 1979, Pages 461-469

  Troutman, Ronald R ^a  

^a IBM   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

INTEGRATED CIRCUITS;

EID: 0018455052     PISSN: 00189383     EISSN: 15579646     Source Type: Journal    
DOI: 10.1109/T-ED.1979.19449     Document Type: Article

References (15)

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