TABLASER: Trace (element) analyzer based on laser ablation and selectively excited radiation

Applied Optics

Volumn 18, Issue 3, 1979, Pages 281-286

  Measures, R M ^a   Kwong, H S ^a  

^a UNIVERSITY OF TORONTO   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

LASERS, DYE;

TRACE ELEMENT ANALYSIS;

SPECTROSCOPIC ANALYSIS;

CHROMIUM; TRACE ELEMENT;

ANALYZER; ELECTRON MICROSCOPY; FLUORESCENCE; FORENSIC MEDICINE; LASER; METHODOLOGY; MICROSCOPY;

EID: 0018438849     PISSN: 1559128X     EISSN: 21553165     Source Type: Journal    
DOI: 10.1364/AO.18.000281     Document Type: Article

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