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Volumn 126, Issue 1, 1979, Pages 131-134
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Optical Evidence for a Silicon-Silicon Oxide Interlayer
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Author keywords
ellipsometry; interface; stress strain
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Indexed keywords
SEMICONDUCDTOR DEVICES - SEMICONDUCTOR INSULATOR BOUNDARIES;
SEMICONDUCTING SILICON;
SILICA;
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EID: 0018290824
PISSN: 00134651
EISSN: 19457111
Source Type: Journal
DOI: 10.1149/1.2128968 Document Type: Article |
Times cited : (129)
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References (21)
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