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Volumn 126, Issue 1, 1979, Pages 131-134

Optical Evidence for a Silicon-Silicon Oxide Interlayer

Author keywords

ellipsometry; interface; stress strain

Indexed keywords

SEMICONDUCDTOR DEVICES - SEMICONDUCTOR INSULATOR BOUNDARIES; SEMICONDUCTING SILICON;

EID: 0018290824     PISSN: 00134651     EISSN: 19457111     Source Type: Journal    
DOI: 10.1149/1.2128968     Document Type: Article
Times cited : (129)

References (21)
  • 6
    • 0342323611 scopus 로고
    • Photoelasticity
    • Harvard University Press, Cambridge
    • E.G. Coker and L.N.G. Filon, “Photoelasticity,” p. 185, Harvard University Press, Cambridge (1957).
    • (1957) , pp. 185
    • Coker, E.G.1    Filon, L.N.G.2
  • 11
    • 84975446686 scopus 로고
    • Optical Properties of Thin Solid Films
    • Academic Press, New York
    • O.S. Heavens, “Optical Properties of Thin Solid Films,” Academic Press, New York (1955).
    • (1955)
    • Heavens, O.S.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.