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Volumn 113, Issue 3, 1978, Pages 277-290
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Critical point drying for scanning electron microscopy: a semi‐automatic method of preparing biological specimens
a a a |
Author keywords
[No Author keywords available]
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Indexed keywords
ELECTRON MICROSCOPY;
METHODOLOGY;
SCANNING ELECTRON MICROSCOPY;
CARBON DIOXIDE;
DESICCATION;
HEAT;
HISTOLOGICAL TECHNIQUES;
MICROSCOPY, ELECTRON, SCANNING;
PLANTS;
PRESERVATION, BIOLOGICAL;
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EID: 0018142909
PISSN: 00222720
EISSN: 13652818
Source Type: Journal
DOI: 10.1111/j.1365-2818.1978.tb00106.x Document Type: Article |
Times cited : (12)
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References (20)
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