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Volumn , Issue , 1978, Pages 160-178
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DEFECTS AND IMPURITIES IN THERMAL SiO2.
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NONE
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Author keywords
[No Author keywords available]
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Indexed keywords
SEMICONDUCTING FILMS - ION IMPLANTATION;
CRYSTALS;
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EID: 0018062167
PISSN: None
EISSN: None
Source Type: Journal
DOI: None Document Type: Conference Paper |
Times cited : (177)
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References (120)
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