BREAKDOWN MECHANISM IN SHORT-CHANNEL MOS TRANSISTORS.

Volumn , Issue , 1978, Pages 478-482

  Sun, E ^a   Moll, J ^a   Berger, J ^a   Alders, B ^a  

^a NONE

Author keywords

[No Author keywords available]

Indexed keywords

INTEGRATED CIRCUITS; SEMICONDUCTOR DEVICES, MIS;

BREAKDOWN MECHANISM;

TRANSISTORS;

EID: 0018059001     PISSN: None     EISSN: None     Source Type: Journal    
DOI: 10.1109/iedm.1978.189459     Document Type: Conference Paper

References (4)