A Practical Approach to Fault Detection in Combinational Networks

IEEE Transactions on Computers

Volumn C-27, Issue 10, 1978, Pages 968-971

  Berger, Israel ^b   Yoeli, Michael ^a  

^a TECHNION ISRAEL INSTITUTE OF TECHNOLOGY   (Israel)

^b IBM   (Israel)

Author keywords

[No Author keywords available]

Indexed keywords

LOGIC CIRCUITS, COMBINATORIAL;

EID: 0018020735     PISSN: 00189340     EISSN: None     Source Type: Journal    
DOI: 10.1109/TC.1978.1674978     Document Type: Article

References (7)

1. M. A. Harrison, Introduction to Switching and Automata Theory. New York: McGraw-Hill, 1965.
2. A. D. Friedman and P. R. Menon, Fault Detection in Digital Circuits. Englewood Cliffs, NJ: Prentice-Hall, 1971.
3. H. Y. Chang, E. G. Manning, and G. Metze, Fault Diagnosis of Digital Systems. New York: Wiley-Interscience, 1970.
4. S. M. Reddy, “Complete test sets for logic functions,” IEEE Trans. Comput., vol. C-22, pp. 1003–1005, Nov. 1973.
5. M. Fridrich and W. A. Davis, “Minimal fault tests for combinational networks,” IEEE Trans. Comput., vol. C-23, pp. 908–910, Aug. 1974.
6. L. Berger and Z. Kohavi, “Fault detection in fan out-free combinational networks,” IEEE Trans. Comput., vol. C-22, pp. 903–905, Oct. 1973.
7. S. S. Yau and Y. S. Tang, “An efficient algorithm for generating complete test sets for combinational logic circuits,” IEEE Trans. Comput., vol. C-20, pp. 1245–1251, Nov. 1971.