|
Volumn 49, Issue 7, 1978, Pages 3879-3889
|
Zero-bias resistance of grain boundaries in neutron-transmutation-doped polycrystalline silicon
|
Author keywords
[No Author keywords available]
|
Indexed keywords
SEMICONDUCTING SILICON;
|
EID: 0017996340
PISSN: 00218979
EISSN: None
Source Type: Journal
DOI: 10.1063/1.325394 Document Type: Article |
Times cited : (241)
|
References (28)
|