Carrier fluctuation noise in a MOSFET channel due to traps in the oxide

Solid State Electronics

Volumn 21, Issue 6, 1978, Pages 901-903

  Jindal, R P ^a   van der Ziel, A ^a  

^a UNIVERSITY OF MINNESOTA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

TRANSISTORS, FIELD EFFECT;

EID: 0017983503     PISSN: 00381101     EISSN: None     Source Type: Journal    
DOI: 10.1016/0038-1101(78)90317-9     Document Type: Article

References (7)

1. Characterization of low 1/f noise in MOS transistors
2. Low frequency noise in MOS transistors—I Theory
3. Theory and experiments on surface 1/f noise