Testing Software Design Modeled by Finite-State Machines

IEEE Transactions on Software Engineering

Volumn SE-4, Issue 3, 1978, Pages 178-187

  Chow, Tsun S ^a  

^a LUCENT TECHNOLOGIES   (United States)

Author keywords

Control structure; finite state machines; reliability; software testing; test covers; validity

Indexed keywords

COMPUTER METATHEORY;

EID: 0017973244     PISSN: 00985589     EISSN: None     Source Type: Journal    
DOI: 10.1109/TSE.1978.231496     Document Type: Article

References (17)

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