On the Peaking of the Hughes Mean Recognition Accuracy: The Resolution of an Apparent Paradox

IEEE Transactions on Systems, Man and Cybernetics

Volumn 8, Issue 5, 1978, Pages 390-395

  Van Campenhout, Jan M ^a  

^a STANFORD UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

PATTERN RECOGNITION SYSTEMS;

EID: 0017969509     PISSN: 00189472     EISSN: 21682909     Source Type: Journal    
DOI: 10.1109/TSMC.1978.4309980     Document Type: Article

References (11)

1. G. F. Hughes, “On the mean accuracy of statistical pattern recognizers,” IEEE Trans. Inform. Theory, vol. IT-14, no. 1, pp. 55–63, Jan. 1968.
2. K. Abend and T. J. Harley, “Comments ‘On the mean accuracy of statistical pattern recognizers’,” IEEE Trans. Inform. Theory, vol. IT-15, pp. 420–421, May 1969.
3. B. Chandrasekaran and T. J. Harley, “Comments ‘On the mean accuracy of statistical pattern recognizers’,” IEEE Trans. Inform. Theory, vol. IT-15, pp. 421–423, May 1969.
4. B. Chandrasekaran, “Independence of measurements and the mean recognition accuracy,” IEEE Trans. Inform. Theory, vol. IT-17, no. 4, pp. 452–456, July 1971.
5. L. Kanal and B. Chandrasekaran, “On dimensionality and sample size in statistical pattern classification,” in Pattern Recognition, vol. 3, pp. 225–234. New York: Pergamon, 1971.
6. B. Chandrasekaran and A. K. Jain, “Quantization complexity and independent measurements,” IEEE Trans. Comput., vol. C-23, pp. 102–106, Jan. 1974.
7. —, “Independence, measurement complexity, and classification performance,” IEEE Trans. Syst., Man, Cybern., vol. SMC-5, no. 2, pp. 240–244, Mar. 1975.
8. W. G. Waller and A. K. Jain, “Mean recognition accuracy of dependent binary measurements,” in Proc. 7th Int. Conf. on Cybernetics and Society, Wash. DC, Sept. 19–21, 1977.
9. K. L. Chung, A Course in Probability Theory. New York: Academic, 1974.
10. T. S. Ferguson, Mathematical Statistics, A Decision Theoretic Approach. New York: Academic, 1967.
11. R. O. Duda and P. E. Hart, Pattern Classification and Scene Analysis. New York: Wiley, 1973.