TREE-TO-TREE DISTANCE AND ITS APPLICATION TO CLUSTER ANALYSIS.

IEEE Transactions on Pattern Analysis and Machine Intelligence

Volumn PAMI-1, Issue 2, 1978, Pages 219-224

  Lu, Shin Yee ^a  

^a NONE

Author keywords

[No Author keywords available]

Indexed keywords

PATTERN RECOGNITION SYSTEMS;

EID: 0017953312     PISSN: 01628828     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Conference Paper

References (10)