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Volumn 150, Issue 1, 1978, Pages 55-70

The characterization of CdTe and HgI2 crystals and detectors by light spot scanning (LSS)

Author keywords

[No Author keywords available]

Indexed keywords

CADMIUM COMPOUNDS; LASER BEAMS - APPLICATIONS;

EID: 0017944503     PISSN: 0029554X     EISSN: None     Source Type: Journal    
DOI: 10.1016/0029-554X(78)90457-3     Document Type: Article
Times cited : (16)

References (39)
  • 5
    • 84913220388 scopus 로고    scopus 로고
    • O. Engström, B. Drugge and P.A. Tove, to be published.
  • 7
    • 0001231984 scopus 로고
    • A NEW IONIZING RADIATION DETECTION CONCEPT WHICH EMPLOYS SEMICONDUCTOR AVALANCHE AMPLIFICATION AND THE TUNNEL DIODE ELEMENT
    • (1966) Applied Physics Letters , vol.9 , pp. 227
    • Locher1    Huth2
  • 37
    • 84913220386 scopus 로고    scopus 로고
    • H. Scholz, Phillips GmbH, Aachen, West Germany, private communication.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.