Wavelength-scanning polarization-modulation ellipsometry: Some practical considerations

Applied Optics

Volumn 17, Issue 4, 1978, Pages 542-552

  Bermudez, Victor M ^a   Ritz, Victor H ^a  

^a NAVAL RESEARCH LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTALS - OPTICAL PROPERTIES; OPTICAL VARIABLES MEASUREMENT; POTASSIUM COMPOUNDS - OPTICAL PROPERTIES; SILVER AND ALLOYS - OPTICAL PROPERTIES;

ELLIPSOMETRY; POTASSIUM CHLORIDE;

OPTICAL INSTRUMENTS;

EID: 0017935469     PISSN: 1559128X     EISSN: 21553165     Source Type: Journal    
DOI: 10.1364/AO.17.000542     Document Type: Article

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