Hot-electron emission from silicon into silicon dioxide

Solid State Electronics

Volumn 21, Issue 1, 1978, Pages 273-282

  Ning, T H ^a  

^a IBM T J WATSON RESEARCH CENTER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

TRANSISTORS, FIELD EFFECT;

SEMICONDUCTOR DEVICES;

EID: 0017908429     PISSN: 00381101     EISSN: None     Source Type: Journal    
DOI: 10.1016/0038-1101(78)90148-X     Document Type: Article

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