메뉴 건너뛰기




Volumn 112, Issue 1, 1978, Pages 103-113

The use of low temperature X‐ray diffraction to evaluate freezing methods used in freeze‐fracture electron microscopy

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON MICROSCOPY; FREEZE FRACTURE; METHODOLOGY; THEORETICAL STUDY; X RAY DIFFRACTION;

EID: 0017802579     PISSN: 00222720     EISSN: 13652818     Source Type: Journal    
DOI: 10.1111/j.1365-2818.1978.tb01158.x     Document Type: Article
Times cited : (101)

References (9)
  • 1
    • 0017840116 scopus 로고
    • The direct measurement of temperature changes within freeze‐fracture specimens during rapid quenching in liquid coolants
    • (1978) J. Microsc. , vol.112 , pp. 17
    • Costello, M.J.1    Corless, J.M.2
  • 4
    • 84981432543 scopus 로고
    • The use of low temperature X‐ray diffraction to evaluate freezing methods used in freeze‐fracture electron microscopy, Proc. Sixth European Congress on Electron Microscopy, Jerusalem, Vol. II p.
    • (1976) , pp. 625
    • Gulik‐Krzywicki, T.1    Costello, M.J.2    Gadet, A.3    Fourme, R.4
  • 5


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.