SCOPUS 정보 검색 플랫폼

Nuclear Instruments and Methods

Volumn 147, Issue 2, 1977, Pages 405-423

Precise relative γ-ray intensities for calibration of Ge semiconductor detectors

(3) Gehrke, R J a Helmer, R G a Greenwood, R C a

a EGG Idaho Inc (United States)

Author keywords

[No Author keywords available]

Indexed keywords

PARTICLE DETECTORS;

GAMMA RAYS;

EID: 0017741249 PISSN: 0029554X EISSN: None Source Type: Journal
DOI: 10.1016/0029-554X(77)90276-2 Document Type: Article

Times cited : (187)

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