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Volumn 25, Issue 12, 1977, Pages 1083-1085
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A Semiautomated Six Port for Measuring Millimeter-Wave Power and Complex Reflection Coefficient
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Author keywords
[No Author keywords available]
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Indexed keywords
MICROWAVE MEASUREMENTS;
REFLECTOMETERS;
WAVEGUIDES;
REFLECTION COEFFICIENT;
SIX-PORT SYSTEM;
MICROWAVE DEVICES;
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EID: 0017720033
PISSN: 00189480
EISSN: 15579670
Source Type: Journal
DOI: 10.1109/TMTT.1977.1129279 Document Type: Article |
Times cited : (19)
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References (2)
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