Real time digital correction of acquisition errors applied to solid state scanners

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 119, Issue , 1977, Pages 172-181

  Little, T R ^a  

^a Naval Command   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

IMAGE PROCESSING;

SCANNERS;

IMAGING TECHNIQUES;

EID: 0017719318     PISSN: 0277786X     EISSN: 1996756X     Source Type: Conference Proceeding    
DOI: 10.1117/12.955711     Document Type: Conference Paper

References (0)