SCOPUS 정보 검색 플랫폼

Volumn 111, Issue 3, 1977, Pages 279-282

Accurate stigmating of a high voltage electron microscope

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON MICROSCOPY; OPTICAL RESOLUTION;

EID: 0017567353 PISSN: 00222720 EISSN: 13652818 Source Type: Journal
DOI: 10.1111/j.1365-2818.1977.tb00068.x Document Type: Article

Times cited : (8)

References (5)

1
- 84981462650
- The response of fluorescent screens to electrons of energy 100–700 keV, Proc. 4th Int. HVEM Conf. (Toulouse), p.
- (1975) , pp. 71
- Camps, R.A.¹ Cosslett, V.E.²

2
- 84981462646
- Recent developments in instrumentation for HVEM, Proc. 4th Int. HVEM Conf. (Toulouse), p.
- (1975) , pp. 13
- Cosslett, V.E.¹

4
- 0002228874
- Phase contrast electron microscopy
- Ed. by, U. Valdré, Academic Press, New York
- (1971) Electron Microscopy in Materials Science , pp. 570
- Thon, F.¹

5
- 84981462873
- Resolution limit of molecular images attainable by transmission electron microscopy
- (1974) Proc. 8th Int. EM Conf. (Canberra) , vol.1 , pp. 226
- Uyeda, N.¹ Ishizuka, K.² Saito, Y.³ Murata, Y.⁴ Kobayashi, K.⁵ Ohara, M.⁶

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.