Store Address Generator with On-Line Fault-Detection Capability

IEEE Transactions on Computers

Volumn C-26, Issue 11, 1977, Pages 1144-1147

  Hsiao, M Y ^a   Patel, A M ^a   Pradhan, D K ^a,b  

^a IBM   (United States)

^b UNIVERSITY OF REGINA   (Canada)

Author keywords

Address generator; Binary counter; Error correcting codes; Fault tolerant computing; Linear feedback shift register

Indexed keywords

STORE ADDRESS GENERATION;

DATA STORAGE, DIGITAL;

EID: 0017558445     PISSN: 00189340     EISSN: None     Source Type: Journal    
DOI: 10.1109/TC.1977.1674762     Document Type: Article

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