-
1
-
-
0017468922
-
Electron traps in bulk and epitaxial GaAs crystals
-
MARTIN, G. M., MITONNEAU, A., and MIRCEA, A.: ‘Electron traps in bulk and epitaxial GaAs crystals’, Electron. Lett, 1977, 13, pp. 191-193
-
(1977)
Electron. Lett
, vol.13
, pp. 191-193
-
-
MARTIN, G.M.1
MITONNEAU, A.2
MIRCEA, A.3
-
2
-
-
0016081559
-
Deep level transient spectroscopy: a new method to characterize traps in semiconductors
-
LANG, D. V.: ‘Deep level transient spectroscopy: a new method to characterize traps in semiconductors’, J. Appl. Phys., 1974, 45, pp. 3023-3033
-
(1974)
J. Appl. Phys.
, vol.45
, pp. 3023-3033
-
-
LANG, D.V.1
-
3
-
-
85024308569
-
-
Sept. (Institute of Physics, London, 33a, 1977)
-
MITONNEAU, A., MARTIN, G. M., and MIRCEA, A.: Proceedings or 6th international symposium on GaAs and related compounds, Edinburgh, Sept. 1976 (Institute of Physics, London, 33a, 1977)
-
(1976)
Proceedings or 6th international symposium on GaAs and related compounds, Edinburgh
-
-
MITONNEAU, A.1
MARTIN, G.M.2
MIRCEA, A.3
-
4
-
-
51649181242
-
A study of deep levels in GaAs by capacitance spectroscopy
-
LANG, D. V., and LOGAN, R. A.: ‘A study of deep levels in GaAs by capacitance spectroscopy’, J. Electron. Mat., 1975, 4, pp. 1053-1066
-
(1975)
J. Electron. Mat.
, vol.4
, pp. 1053-1066
-
-
LANG, D.V.1
LOGAN, R.A.2
-
5
-
-
84918026646
-
Temperature dependence of ionization energies of deep bound states in semiconductors
-
MIRCEA, A., MITONNEAU, A., and VANNIMENUS, J.: ‘Temperature dependence of ionization energies of deep bound states in semiconductors’, J. Physique (Lettres), 1977, 38, L41-L43
-
(1977)
J. Physique (Lettres)
, vol.38
, pp. L41-L43
-
-
MIRCEA, A.1
MITONNEAU, A.2
VANNIMENUS, J.3
-
7
-
-
0016443714
-
A new technique for defect spectroscopy in semiconductors: application to 1-MeV electron irradiated n-GaAs
-
Institute of Physics, London
-
LANG, D. V., and KIMERLING, L. C.: ‘A new technique for defect spectroscopy in semiconductors: application to 1-MeV electron irradiated n-GaAs’ in ‘Lattice defects in semiconductors’ (Institute of Physics, London, 1974), pp. 581-588
-
(1974)
Lattice defects in semiconductors
, pp. 581-588
-
-
LANG, D.V.1
KIMERLING, L.C.2
-
8
-
-
0016129511
-
Deep levels in GaAs by capacitance methods
-
SAKAI, K., and IKOMA, T.: ‘Deep levels in GaAs by capacitance methods’, Appl. Phys., 1974, 5, pp. 165-171
-
(1974)
Appl. Phys.
, vol.5
, pp. 165-171
-
-
SAKAI, K.1
IKOMA, T.2
-
9
-
-
0016535704
-
Majority-carrier traps in n- and p-type epitaxial GaAs
-
HASEGAWA, H., and MAJERFELD, A.: ‘Majority-carrier traps in n- and p-type epitaxial GaAs’, Electron. Lett., 1975, 11, pp. 286-289
-
(1975)
Electron. Lett.
, vol.11
, pp. 286-289
-
-
HASEGAWA, H.1
MAJERFELD, A.2
-
10
-
-
0016938588
-
Energy spectrum of V impurities in GaAs
-
VASILIEV, A. V., IPPOLITOVA, G. K., OMEL'YANOVSKII, E. M., and RYSKIN, A. I.: ‘Energy spectrum of V impurities in GaAs’, Sov. Phys. Semicond., 1976, 10, pp. 341-342
-
(1976)
Sov. Phys. Semicond.
, vol.10
, pp. 341-342
-
-
VASILIEV, A.V.1
IPPOLITOVA, G.K.2
OMEL'YANOVSKII, E.M.3
RYSKIN, A.I.4
|