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Volumn 13, Issue 22, 1977, Pages 666-668

Hole traps in bulk and epitaxial gaas crystals

Author keywords

Gallium arsenide; Hole traps; III V semiconductors; Semiconductor epitaxial layers

Indexed keywords

GALLIUM ARSENIDE;

EID: 0017542223     PISSN: 00135194     EISSN: None     Source Type: Journal    
DOI: 10.1049/el:19770473     Document Type: Article
Times cited : (220)

References (10)
  • 1
    • 0017468922 scopus 로고
    • Electron traps in bulk and epitaxial GaAs crystals
    • MARTIN, G. M., MITONNEAU, A., and MIRCEA, A.: ‘Electron traps in bulk and epitaxial GaAs crystals’, Electron. Lett, 1977, 13, pp. 191-193
    • (1977) Electron. Lett , vol.13 , pp. 191-193
    • MARTIN, G.M.1    MITONNEAU, A.2    MIRCEA, A.3
  • 2
    • 0016081559 scopus 로고
    • Deep level transient spectroscopy: a new method to characterize traps in semiconductors
    • LANG, D. V.: ‘Deep level transient spectroscopy: a new method to characterize traps in semiconductors’, J. Appl. Phys., 1974, 45, pp. 3023-3033
    • (1974) J. Appl. Phys. , vol.45 , pp. 3023-3033
    • LANG, D.V.1
  • 4
    • 51649181242 scopus 로고
    • A study of deep levels in GaAs by capacitance spectroscopy
    • LANG, D. V., and LOGAN, R. A.: ‘A study of deep levels in GaAs by capacitance spectroscopy’, J. Electron. Mat., 1975, 4, pp. 1053-1066
    • (1975) J. Electron. Mat. , vol.4 , pp. 1053-1066
    • LANG, D.V.1    LOGAN, R.A.2
  • 5
    • 84918026646 scopus 로고
    • Temperature dependence of ionization energies of deep bound states in semiconductors
    • MIRCEA, A., MITONNEAU, A., and VANNIMENUS, J.: ‘Temperature dependence of ionization energies of deep bound states in semiconductors’, J. Physique (Lettres), 1977, 38, L41-L43
    • (1977) J. Physique (Lettres) , vol.38 , pp. L41-L43
    • MIRCEA, A.1    MITONNEAU, A.2    VANNIMENUS, J.3
  • 7
    • 0016443714 scopus 로고
    • A new technique for defect spectroscopy in semiconductors: application to 1-MeV electron irradiated n-GaAs
    • Institute of Physics, London
    • LANG, D. V., and KIMERLING, L. C.: ‘A new technique for defect spectroscopy in semiconductors: application to 1-MeV electron irradiated n-GaAs’ in ‘Lattice defects in semiconductors’ (Institute of Physics, London, 1974), pp. 581-588
    • (1974) Lattice defects in semiconductors , pp. 581-588
    • LANG, D.V.1    KIMERLING, L.C.2
  • 8
    • 0016129511 scopus 로고
    • Deep levels in GaAs by capacitance methods
    • SAKAI, K., and IKOMA, T.: ‘Deep levels in GaAs by capacitance methods’, Appl. Phys., 1974, 5, pp. 165-171
    • (1974) Appl. Phys. , vol.5 , pp. 165-171
    • SAKAI, K.1    IKOMA, T.2
  • 9
    • 0016535704 scopus 로고
    • Majority-carrier traps in n- and p-type epitaxial GaAs
    • HASEGAWA, H., and MAJERFELD, A.: ‘Majority-carrier traps in n- and p-type epitaxial GaAs’, Electron. Lett., 1975, 11, pp. 286-289
    • (1975) Electron. Lett. , vol.11 , pp. 286-289
    • HASEGAWA, H.1    MAJERFELD, A.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.